In Scanning Electron Microscopy?

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. ... The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

What is scanning electron microscopy used for?

Because of its great depth of focus, a scanning electron microscope is the EM analog of a stereo light microscope. It provides detailed images of the surfaces of cells and whole organisms that are not possible by TEM. It can also be used for particle counting and size determination, and for process control.

What is the principle of scanning electron microscope?

The working principle is based on the generation of electron-hole pairs by the backscattered electrons which escape the sample and are absorbed by the detector. The amount of these pairs depends on the energy of the backscattered electrons.